1.
Three Faces of Test : Design, Characterization, Production: International Test Conference, 1...
by IEEE Computer Society, Test...
ISBN: 9780818605482
2.
International Test Conference 1983 Proceedings Testing's Changing Role
by IEEE Computer Society, Test...
ISBN: 9780818605024
List Price: $66.00
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2006 IEEE Workshop on Signal Propagation on Interconnects
by Components, Packaging & Man...
ISBN: 9781424404544
List Price: $190.00
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Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August...
by Rajsuman, Rochit, IEEE Comp...
ISBN: 9780818662461
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New Frontiers in Testing : International Test Conference, 1988 Proceedings, September 12, 13...
by IEEE Computer Society, Test...
ISBN: 9780818648700
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Three Faces of Test : Design, Characterization, Production: International Test Conference, 1...
by IEEE Computer Society, Test...
ISBN: 9780818645488
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Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jo...
by Rajsuman, Rochit, IEEE Comp...
ISBN: 9780818641510
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Digest of Papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Wa...
by Tong, Carol, Jayasumana, An...
ISBN: 9780818676574
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2010 25th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2...
by Chapman, Glenn, IEEE Comput...
ISBN: 9780769542430
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2009 27th IEEE VLSI Test Symposium : Proceedings: 3-7 May 2009 Santa Cruz, CA, USA: VTS 2009
by IEEE Computer Society, Test...
ISBN: 9780769535982
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2007 International Conference on Microelectronic Systems Education (MSE 2007) : San Diego, C...
by IEEE Computer Society, Desi...
ISBN: 9780769528496
List Price: $192.00
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1999 IEEE International Conference on Microelectronic Systems Education (MSE'99) : Systems E...
by IEEE Computer Society, Desi...
ISBN: 9780769503141
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1999 IEEE International Conference on Microelectronic Systems Education (MSE'99) : Systems E...
by IEEE Computer Society, Desi...
ISBN: 9780769503134
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IEEE International Workshop on Rapid Systems Prototyping : Proceedings: June 16-18, 1999, Cl...
by IEEE Computer Society, Tech...
ISBN: 9780769502489
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10th Anniversary Compendium of Papers from Asian Test Symposium : Proceedings: 1992-2001
by IEEE Computer Society, Test...
ISBN: 9780769512358
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ITC : International Test Conference 2001: Proceedings: October 30-November 1, 2001, Baltimor...
by IEEE Computer Society, Test...
ISBN: 9780780371705
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1997 IEEE International Conference on Microelectronic Systems Education, MSE'97: Doing more ...
by IEEE Computer Society, Desi...
ISBN: 9780818679971
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21st IEEE International Symposium on Defect and Fault-tolerance in Vsli Systems (Dft 2006)
by Park, Nohpill, IEEE Compute...
ISBN: 9780769527062
List Price: $229.00
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Proceedings IEEE 1985 Workshop on Simulation and Test Generation Environments/Cz732
by IEEE Computer Society Staff...
ISBN: 9780818607325
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Simulation and Test Generation Environments, IEEE Workshop Proceedings/86Ch2296-2
by IEEE Computer Society Staff...
ISBN: 9780818687327
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Microelectronics Systems Education (Mse '99), 1999 International Conference on IEEE Computer...
by IEEE Computer Society, Desi...
ISBN: 9780769503127
List Price: $110.00
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Curriculum for Test Technology/Pbn 83Ch1978-6
by IEEE Computer Society, Test...
ISBN: 9780818605208
List Price: $24.00
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Bridging Faults and Iddq Testing
by Malaiya, Yashwant K., Rajsu...
ISBN: 9780818632167
List Price: $35.00